Exploring the excitonic and stimulated emission in ZnO thin films and nanorods
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Abstract
This article investigates the structural and optical properties of Zinc Oxide (ZnO ) thin films and nanorods, utilizing X -ray diffraction (XRD) and photoluminescence (PL) analysis to characterize their suitability for optoelectronic applications. The study confirms the hexagonal wurtzite structure of ZnO, emphasizing the presence of distinct crystallographic planes that indicate high-quality crystalline formation. Photoluminescence results highlight a critical transition from spontaneous to stimulated emission in ZnO nanorods, driven by exciton interactions at various excitation fluences. These findings suggest that ZnO nanostructures, with their advanced emission properties and structural integrity, hold substantial promise for enhancing the performance of photonic devices.
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References
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